A new ion sensing deep atomic force microscope
نویسندگان
چکیده
منابع مشابه
A New Type of Atomic Force Microscope
6 Local flow variation (LFV) method of nonlinear time series analysis is applied to 7 develop a chaotic motion based atomic force microscope (AFM). The method is 8 validated by analyzing time series from a simple numerical model of a tapping mode 9 AFM. For both calibration and measurement procedures the simulated motions of 10 the AFM are nominally chaotic. However, the distance between a tip ...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2014
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.4893640